发明名称 Manufacturing method and testing method for magnetoresistance effect element
摘要 At the wafer stage of a manufacturing process of magnetoresistive effect elements, the characteristics of the magnetoresistive effect elements can be correctly measured, fluctuations in the characteristics of the magnetoresistive effect elements can be suppressed, and highly reliable magnetoresistive effect elements can be manufactured with a high yield. A method of manufacturing a magnetoresistive effect element includes a process that forms terminals that electrically connect a lower shield layer on both sides of a final position of a air bearing surface and a process that forms terminals that electrically connect an upper shield layer on both sides of a final position of a air bearing surface.
申请公布号 US2008168648(A1) 申请公布日期 2008.07.17
申请号 US20070986469 申请日期 2007.11.21
申请人 FUJITSU LIMITED 发明人 HASHIMOTO JUNICHI
分类号 G11B5/39;H01R9/00 主分类号 G11B5/39
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