发明名称 |
SEMICONDUCTOR DEVICE AND PROCESS FOR PRODUCING THE SAME |
摘要 |
On inferior electrode (8) there are superimposed titanium oxide film (10), nickel oxide film (11) and superior electrode (12). The above inferior electrode (8), titanium oxide film (10), nickel oxide film (11) and superior electrode (12) constitute resistor element (VR). The thickness of the titanium oxide film (10) is 5 nm, and that of the nickel oxide film (11) is 60 nm. The ratio of oxygen in nickel oxide constructing the nickel oxide film (11) is lower than the ratio of oxygen in stoichiometric composition. |
申请公布号 |
WO2008107941(A1) |
申请公布日期 |
2008.09.12 |
申请号 |
WO2007JP53884 |
申请日期 |
2007.03.01 |
申请人 |
FUJITSU LIMITED;KINOSHITA, KENTARO;YOSHIDA, CHIKAKO |
发明人 |
KINOSHITA, KENTARO;YOSHIDA, CHIKAKO |
分类号 |
H01L27/10 |
主分类号 |
H01L27/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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