发明名称 Measuring element, measuring body and measuring arrangement for measuring a force, and use of such a measuring body
摘要 A measuring element formed of a piezoelectric crystal of symmetry class 32 for measuring a force Fz, which acts perpendicularly on the plane x-y and causes a charge accumulation on surfaces of the plane x-y. Applications are measurements in which the transverse forces Fxy orthogonal to the force Fz, which generate an error signal at the measuring element, are expected on the measuring body. The measuring element includes at least four identical measuring element segments having straight edges. In the x-y plane the segments are arranged side by side and spaced apart by narrow gaps at the edges. Together, the segments form the shape of a disc or perforated disc for reducing the interference signals caused by the transverse forces Fxy on the measuring element. The crystal orientations in the x-y plane of all segments are oriented in the same direction or orthogonal to each other.
申请公布号 US9347839(B2) 申请公布日期 2016.05.24
申请号 US201314404663 申请日期 2013.06.20
申请人 KISTLER HOLDING AG 发明人 Kohler Denis
分类号 G01L1/00;G01L1/16;G01L5/16 主分类号 G01L1/00
代理机构 Dority & Manning, P.A. 代理人 Dority & Manning, P.A.
主权项 1. A measuring element made of a piezoelectric crystal of symmetry class 32, and which is realized flat in a plane x-y and intended for installation into a measuring body for measuring a force Fz that acts perpendicularly upon the plane x-y and causes a charge accumulation on the surfaces of the measuring element that receive the force Fz and are provided with electrodes, and wherein transverse forces Fxy that act orthogonally to the force Fz and generate an error signal at the measuring element are expected upon the measuring body during a measurement, the measuring element comprising: at least four identical measuring element segments, each segment including a crystal with straight flanks, wherein the segments are in the x-y plane adjacently arranged close to one another and spaced apart by narrow gaps at the flanks, and wherein said segments jointly form the shape of a disk or perforated disk in order to reduce the interference signals caused by transverse forces Fxy acting upon the measuring element, and in that the crystal orientations are aligned in the same direction or orthogonally to one another in the x-y plane of all segments.
地址 Winterthur CH