发明名称 |
Optical position measuring instrument |
摘要 |
An optical position measuring instrument including a first scale having a first graduation, wherein the first scale is disposed movable in a first measuring direction, and at a first defined position in the first measuring direction, the first scale includes a spatially limited first marking that differs from the first graduation. The optical position measuring instrument further including a second scale having a second graduation, wherein the second scale is disposed movable in a second measuring direction, and at a second defined position, the second scale includes a second reference marking that is usable for generating at least one reference signal at a reference position of the second scale only if the first scale is located in the first defined position. |
申请公布号 |
US9389100(B2) |
申请公布日期 |
2016.07.12 |
申请号 |
US201314075088 |
申请日期 |
2013.11.08 |
申请人 |
DR. JOHANNES HEIDENHAIN GMBH |
发明人 |
Holzapfel Wolfgang;Drescher Joerg;Meissner Markus;Joerger Ralph;Musch Bernhard;Kaelberer Thomas |
分类号 |
G01B11/24;G01D5/26;G01D5/347 |
主分类号 |
G01B11/24 |
代理机构 |
Brinks Gilson & Lione |
代理人 |
Brinks Gilson & Lione |
主权项 |
1. An optical position measuring instrument, comprising:
a first scale comprising a first graduation, wherein said first scale is disposed movable in a first measuring direction, and, at a certain position, said first scale comprises a first marking that is finite in size, differs from said first graduation, and indicates a first defined position of said scale in space and along said first measuring direction; and a second scale comprising a second graduation, wherein said second scale is disposed movable in a second measuring direction, and, at a second defined position of a portion of said second scale, said second scale comprises a reference marking that has a structure that generates at least one reference signal at a reference position of said second scale only if said first scale is located in said first defined position. |
地址 |
Traunreut DE |