发明名称 Optical position measuring instrument
摘要 An optical position measuring instrument including a first scale having a first graduation, wherein the first scale is disposed movable in a first measuring direction, and at a first defined position in the first measuring direction, the first scale includes a spatially limited first marking that differs from the first graduation. The optical position measuring instrument further including a second scale having a second graduation, wherein the second scale is disposed movable in a second measuring direction, and at a second defined position, the second scale includes a second reference marking that is usable for generating at least one reference signal at a reference position of the second scale only if the first scale is located in the first defined position.
申请公布号 US9389100(B2) 申请公布日期 2016.07.12
申请号 US201314075088 申请日期 2013.11.08
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 Holzapfel Wolfgang;Drescher Joerg;Meissner Markus;Joerger Ralph;Musch Bernhard;Kaelberer Thomas
分类号 G01B11/24;G01D5/26;G01D5/347 主分类号 G01B11/24
代理机构 Brinks Gilson & Lione 代理人 Brinks Gilson & Lione
主权项 1. An optical position measuring instrument, comprising: a first scale comprising a first graduation, wherein said first scale is disposed movable in a first measuring direction, and, at a certain position, said first scale comprises a first marking that is finite in size, differs from said first graduation, and indicates a first defined position of said scale in space and along said first measuring direction; and a second scale comprising a second graduation, wherein said second scale is disposed movable in a second measuring direction, and, at a second defined position of a portion of said second scale, said second scale comprises a reference marking that has a structure that generates at least one reference signal at a reference position of said second scale only if said first scale is located in said first defined position.
地址 Traunreut DE