发明名称 DATA VERIFICATION METHOD FOR DATA CONVERTING APPARATUS
摘要 A method of verifying electron beam data used to produce a photomask comprises dividing design data for the photomask into a plurality of repetitive regions, sequentially converting the sequential regions into electron beam data, and determining whether electron beam data corresponding to a current repetitive region is substantially identical to electron beam data corresponding to a previous repetitive region.
申请公布号 KR20060039364(A) 申请公布日期 2006.05.08
申请号 KR20040088510 申请日期 2004.11.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG, SUNG HOON;AHN, BYOUNG SUP;NO, YOUNG HWA
分类号 H01L21/027;G03F1/20;G03F1/78;G03F1/86;H01L21/66 主分类号 H01L21/027
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