发明名称 Testable embedded microprocessor and method of testing same
摘要 A technique of gaining direct access to the inputs and outputs of an embedded microprocessor, otherwise buried behind additional logic, is disclosed. Multiplexers are provided for at least the embedded microprocessor inputs and outputs. In a test mode, the multiplexers connect device input and output pads directly to the embedded microprocessor inputs and outputs. In a normal operating mode, the multiplexers connect the additional logic to the input and output pads. Preferably, in order to standardize design criteria, multiplexers are provided on all of the inputs and outputs of the microprocessor which may become embedded behind additional logic. Additionally, it is possible in the test mode to control the additional logic to a well defined state. The invention provides a simple way to isolate the embedded microprocessor from the rest of the logic and test it thoroughly using test vectors that have already been developed for the stand-alone microprocessor.
申请公布号 US5254940(A) 申请公布日期 1993.10.19
申请号 US19900628202 申请日期 1990.12.13
申请人 LSI LOGIC CORPORATION 发明人 OKE, TIMOTHY P.;CUMMINGS, II, RUSSELL E.;GAVRIELOV, NACHUM M.
分类号 G06F11/267;(IPC1-7):G01R31/28 主分类号 G06F11/267
代理机构 代理人
主权项
地址