发明名称 ELECTROSTATIC DISCHARGE PROTECTING DEVICE HAVING HETERO-JUNCTION STRUCTURE
摘要 <p>PROBLEM TO BE SOLVED: To achieve higher speed turning on of a parasitic bipolar transistor by providing a material layer with a potential lower than that of the silicon substrate in the silicon substrate between the source and the drain. SOLUTION: A material layer 50 with a potential lower than that of the silicon substrate 10 is formed in the silicon substrate 10 between the source 20 and the drain 30. This material layer 50 serves to collect holes from among electrons and holes generated by a strong electric field in the drain region produced by an electrostatic discharge pulse. Further, the material layer 50 is formed of a hetero-junction structure. Therefore, the material layer 50 has an energy gap smaller than that of the silicon forming the substrate 10 so that it can form a quantum well with a potential lower than that of the substrate 10 and it can rapidly drive a parasitic bipolar transistor because the electrons and holes of germanium have a large mobility. Thus, higher speed turning ON of the parasitic bipolar transistor can be achieved and a overcurrent can be prevented from flowing into the chip.</p>
申请公布号 JPH09213714(A) 申请公布日期 1997.08.15
申请号 JP19960015790 申请日期 1996.01.31
申请人 SAMSUNG ELECTRON CO LTD 发明人 SAI SOUKUN;RI SOUKUN;PAKU YANKAN;KIN KEIKOU
分类号 H01L29/812;H01L21/338;H01L21/822;H01L27/04;(IPC1-7):H01L21/338 主分类号 H01L29/812
代理机构 代理人
主权项
地址