DEVICE FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS METHOD AND METHOD FOR ADJUSTING TIMING AND METHOD FOR ADJUSTING TEST VECTOR ADDRESS

摘要

PROBLEM TO BE SOLVED: To realize a device for testing a semiconductor integrated circuit for realizing the reinforcement or extension of a testing function without operating any reinforcement or extension of a new function at the testing device. SOLUTION: Plural testing devices are connected with a semiconductor integrated circuit 5, and a clock output synchronizing circuit 11 of a master device 1A is connected with an outside clock synchronizing circuit 12 of a slave device 1B. Then, the transmission and reception of a test vector with the semiconductor integrated circuit 5 is operated in a state that the master device 1A is synchronized with the slave device 1B by controlling operation control signal inputting circuits 14 and operation control signal outputting circuits 13 of the master device 1A and the slave device 1B. Thus, it is possible to perform the test by complementing a function which is short in a single testing device 1.