发明名称 |
Apparatus and method for managing bad blocks in a flash memory |
摘要 |
<p>A method and an apparatus for managing bad blocks generated while a flash memory (100) is being used. A method for managing a bad block in a flash memory (100) includes (a) allocating a used area (110) having a plurality of used blocks and a spare area (120) having a plurality of spare blocks in the flash memory (100), and providing a block map page group (150) including a plurality of block map pages in which mapping information to map a bad block generated in either of the used area (110) or the spare block to a spare block, (b) having mapping information of the block map page reside in a main memory (400), and (c) mapping the bad block generated during a flash operation to an unused spare block found through the mapping information, updating the mapping information, and recording the updated mapping information on the block map page.</p> |
申请公布号 |
EP1469481(A2) |
申请公布日期 |
2004.10.20 |
申请号 |
EP20040252027 |
申请日期 |
2004.04.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOON, SONG-HO;KIM, JANG-HWAN;KIM, BUM-SOO;CHUNG, TAE-SUN;IN, JI-HYUN |
分类号 |
G06F11/00;G06F12/02;G06F12/14;G06F12/16;G11C7/00;G11C11/34;G11C16/04;G11C16/22;G11C29/00;(IPC1-7):G11C29/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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