发明名称 Bonding pattern discrimination method, bonding pattern discrimination device and bonding pattern discrimination program
摘要 Determination of inclination of positioning patterns used in bonding being made by: imaging a positioning pattern of reference chip and taking such image as reference-image; specifying a polar coordinate conversion origin for the reference-image; imaging an object (chip) of bonding to use it as an object-image, thus obtaining a relative positional-relationship with the reference-image; specifying the polar coordinate conversion origin of the object-image, so that the object-image is subjected to a polar coordinate conversion; and calculating inclination-angle from both images that have been subjected to a polar coordinate conversion; thus using a point, in which an error in position of the object of comparison detected by pattern matching between an image, which is the object of comparison obtained by imaging the object of comparison disposed in an attitude that includes positional deviation, and the reference-image, shows a minimal value, as an origin of the polar coordinate conversion.
申请公布号 US2005167470(A1) 申请公布日期 2005.08.04
申请号 US20040959241 申请日期 2004.10.06
申请人 KABUSHIKI KAISHA SHINKAWA 发明人 ENOKIDO SATOSHI
分类号 H01L21/60;B23K20/00;H01L21/52;(IPC1-7):B23K31/02 主分类号 H01L21/60
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