发明名称 Semiconductor device having high-voltage and low-voltage operation regions and method of fabricating the same
摘要 A semiconductor device includes a first region formed with a first gate insulator and operated by a first operating voltage, a second region formed with a second gate insulator made from a material having a higher dielectric constant than a material of the first insulator, the second region being operated by a second operating voltage lower than the first operating voltage, and gate electrodes including at least lowest layers which are in contact with the first and second gate insulators and are formed together with element isolation regions by a self-alignment manner respectively.
申请公布号 US2005167760(A1) 申请公布日期 2005.08.04
申请号 US20040010343 申请日期 2004.12.14
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAKAYASU JUN
分类号 H01L21/8234;H01L21/336;H01L21/8247;H01L27/088;H01L27/10;H01L27/115;H01L29/51;H01L29/78;H01L29/788;H01L29/792;H01L31/062;(IPC1-7):H01L31/062 主分类号 H01L21/8234
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