发明名称 |
Manufacturing method for an electronic device, and the electronic device |
摘要 |
The present invention provides a manufacturing method for an electronic device that enables high-yield manufacturing of electronic devices, by detecting potential short circuits between a contact plug and a conductive part contacting the periphery of the contact plug, directly after forming the contact plug; and the electronic device. The manufacturing method includes a hole-forming step of forming a contact hole in an insulating film that covers a conductive part formed on a first main surface of a substrate and an area surrounding the conductive part, the hole being formed beside the conductive part, and the conductive part including a first material; a material-supplying step of supplying a second material to the contact hole, the second material having a reactive property with the first material; and an inspection step, after the second material has been supplied, of inspecting for evidence of a reaction by the conductive part with the second material.
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申请公布号 |
US7052624(B2) |
申请公布日期 |
2006.05.30 |
申请号 |
US20030621502 |
申请日期 |
2003.07.17 |
申请人 |
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
MATSUTANI TETSUYA;JIWARI NOBUHIRO |
分类号 |
H01L21/00;H01L21/66;H01L21/302;H01L21/461;H01L21/60;H01L21/768 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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