发明名称 METHODS FOR FABRICATING HIGH ASPECT RATIO PROBES AND DEFORMING HIGH ASPECT RATIO NANOPILLARS AND MICROPILLARS
摘要 Methods for fabricating of high aspect ratio probes and deforming micropillars and nanopillars are described. Use of polymers in deforming nanopillars and micropillars is also described.
申请公布号 US2016280537(A1) 申请公布日期 2016.09.29
申请号 US201615178512 申请日期 2016.06.09
申请人 CALIFORNIA INSTITUTE OF TECHNOLOGY 发明人 HENRY Michael D.;HOMYK Andrew P.;SCHERER Axel;TOMBRELLO Thomas A.;WALAVALKAR Sameer
分类号 B81C1/00;B81B1/00;B01J19/00 主分类号 B81C1/00
代理机构 代理人
主权项 1. A method for fabricating an array of high aspect ratio probes, comprising: providing a substrate; coating the substrate with a first resist; defining high aspect ratio nanopillars by lithographically patterning the first resist, thus forming a patterned first resist; developing, with a developer, the patterned first resist to remove portions of the first resist on the substrate, thus forming a developed first resist and exposing portions of the substrate; depositing an etch mask on the developed first resist and the exposed portions of the substrate to mask the exposed portions of the substrate; placing the substrate in a chemical bath to dissolve, by way of chemical reactions, the developed first resist and the deposited etch mask on the developed first resist such that the deposited etch mask on the substrate remains undissolved; and performing an etch with a SF6/C4F8 etch, thus establishing high aspect ratio nanopillars.
地址 PASADENA CA US