| 发明名称 |
SEMICONDUCTOR APPARATUS AND DIAGNOSTIC TEST METHOD |
| 摘要 |
A semiconductor apparatus includes a storage circuit, a processing circuit that performs processing using data stored in the storage circuit and writes data into the storage circuit as the processing is performed, a scan test circuit that executes a scan test on the processing circuit when the processing circuit does not perform processing, and an inhibit circuit that inhibits writing of data from the processing circuit to the storage circuit when the scan test on the processing circuit is executed. |
| 申请公布号 |
US2016349322(A1) |
申请公布日期 |
2016.12.01 |
| 申请号 |
US201615093988 |
申请日期 |
2016.04.08 |
| 申请人 |
Renesas Electronics Corporation |
发明人 |
SHIBAHARA Shinichi;KAWAKAMI Daisuke;IGAKU Yutaka |
| 分类号 |
G01R31/3177;G01R31/317 |
主分类号 |
G01R31/3177 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor apparatus comprising:
a storage circuit; a processing circuit that performs processing using data stored in the storage circuit and writes data into the storage circuit as the processing is performed; a scan test circuit that executes a scan test on the processing circuit when the processing circuit does not perform processing; and an inhibit circuit that inhibits writing of data from the processing circuit to the storage circuit when the scan test on the processing circuit is executed. |
| 地址 |
Tokyo JP |
