发明名称 Silicon-on-insulator (SOI) substrate and method for manufacturing the same
摘要 A silicon-on-insulator (SOI) substrate includes a silicon substrate including an active region defined by a field region that surrounds the active region for device isolation. The field region includes a first oxygen-ion-injected isolation region and a second oxygen-ion-injected isolation region. The first oxygen-ion-injected isolation region has a first thickness and is disposed under the active region, a center of the first oxygen-ion-injected isolation region being at a first depth from a top surface of the silicon substrate. The second oxygen-ion-injected isolation region has a second thickness that is greater than the first thickness, the second oxygen-ion-injected isolation region disposed at sides of the active region and formed from a ton surface of the silicon substrate, a center of the second oxygen-ion-injected region disposed at a second depth from the top surface of the silicon substrate.
申请公布号 US7064387(B2) 申请公布日期 2006.06.20
申请号 US20040874403 申请日期 2004.06.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JANG TAE-HO
分类号 H01L27/01;H01L27/12;H01L21/762;H01L21/84;H01L31/0392 主分类号 H01L27/01
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