发明名称 FERROELECTRIC MATERIAL, CAPACITOR, MEMORY AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a ferroelectric material, capacitor, memory and manufacture thereof whereby damage of the capacitor due to short circuit can be lessened by suppressing a leakage current low. SOLUTION: On a substrate 11 a lower electrode 13, ferroelecric film 14 and upper electrode 15 are layered through a bond layer 12. The ferroelectric film 14 is made of Srx Biy (Ta1-u Nbu )2 Tiz O9±d (0.6<=y<=1.2, 1.7<=y<=2.5, 0<=y<=1.0, 0.1<=z<=1.0, 0.0<=d<=1.0). To is contained a little to suppress increase of a leak current due to applied voltage, lessen short circuit and improve temp. characteristic. Dielectric polarization characteristic and fatigue characteristic can be held high.
申请公布号 JPH11204744(A) 申请公布日期 1999.07.30
申请号 JP19980006132 申请日期 1998.01.14
申请人 SONY CORP 发明人 HIRONAKA KATSUYUKI;TANAKA NAOHIRO;KATORI KENJI;IKEDA YUJI;ISOBE CHIHARU
分类号 C30B29/22;C23C14/08;C23C14/34;C23C16/40;H01L21/8242;H01L21/8246;H01L21/8247;H01L27/10;H01L27/105;H01L27/108;H01L29/788;H01L29/792;(IPC1-7):H01L27/10;H01L21/824 主分类号 C30B29/22
代理机构 代理人
主权项
地址