WAFER LEVEL PACKAGE AND METHOD OF FABRICATING THE SAME
摘要
<p>A wafer package and a manufacturing method thereof are provided to minimize reliability reduction of connectivity due to an excessive protrusion of a connection device by forming the connection device penetrating a floor of a trench, after forming the trench according to a scribe line. A plurality of semiconductor chips having a connection pad are formed on a wafer(S10). A trench is formed under the connection pad by patterning a bottom surface of the wafer(S30). A via hole exposing the bottom surface of the connection pad is formed by patterning the bottom surface of the trench(S50). A connection device is formed and connected to the connection pad through the via hole(S60).</p>
申请公布号
KR20070112646(A)
申请公布日期
2007.11.27
申请号
KR20060045802
申请日期
2006.05.22
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
CHUNG, HYUN SOO;LEE, IN YOUNG;HWANG, SON KWAN;LEE, DONG HO;HWANG, SEONG DEOK