发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To reduce variation in TFTs and also cut down a number of masks, reduce the number of production processes and shorten periods of production processes, when manufacturing a semiconductor device having an N-type thin-film transistor and a P-type thin-film transistor. SOLUTION: The method of manufacturing a semiconductor device includes a process of forming an island-shaped semiconductor layer of a first thin-film transistor and thereafter, forming an island-shaped semiconductor layer of a second thin-film transistor, in which, when the island-shaped semiconductor layer of the second thin-film transistor is formed, a gate insulating film, in contact with the island-shaped semiconductor layer of the second thin-film transistor, is also used as a protective film (etching stopper film) for the island-shaped semiconductor layer of the first thin-film transistor. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008211195(A) 申请公布日期 2008.09.11
申请号 JP20080017045 申请日期 2008.01.29
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 HOSOYA KUNIO;FUJIKAWA SAISHI
分类号 H01L29/786;H01L21/336;H01L21/8234;H01L21/8238;H01L27/06;H01L27/08;H01L27/092 主分类号 H01L29/786
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