发明名称 粒子撮像デバイスにおける測定精度を上げるための装置、システムおよび方法
摘要 An apparatus, system, and method for increasing measurement accuracy in imaging cytometry. The system may include a light detector configured to measure light emitted by a first particle and light emitted by a second particle, where the measured light from the second particle at least partially overlaps the measured light from the first particle in an overlap region. Additionally, the system may include a processor coupled to the light detector, where the processor is configured to determine a contribution of light from the first particle in the overlap region and determine a contribution of light from the second particle in the overlap region. The processor may also be configured to subtract the contribution of light from the second particle from the contribution of light from the first particle and determine the intensity of light emitted by the first particle.
申请公布号 JP6018232(B2) 申请公布日期 2016.11.02
申请号 JP20150012039 申请日期 2015.01.26
申请人 ルミネックス コーポレーション 发明人 ロス,ウェイン,デニス;フィッシャー,マシュー,エス
分类号 G01N15/14 主分类号 G01N15/14
代理机构 代理人
主权项
地址