发明名称 VOLTAGE MARGIN TESTING SYSTEM
摘要 PURPOSE:To attain to enhance the speed and accuracy of a voltage margin test by automating the change in a voltage value, by performing the change in a voltage value on the basis of the program in a system power source control part. CONSTITUTION:Arbitrary voltage change indication data is set to an arbitrary DA converter in arbitrary order by the control of a voltage control processor 4 during a voltage margin test. The voltage change indication data set to DA converters 6-1-6-m receive AD conversion and the converted signals are amplified by corresponding operational amplifiers 7-1-7-m to be outputted to a DC power source part as voltage change indication signals through operational relays 8-1-8-m. In the DC power source part, a test program is performed under a deviated voltage value and a logical apparatus is tested.
申请公布号 JPS61155971(A) 申请公布日期 1986.07.15
申请号 JP19840277476 申请日期 1984.12.28
申请人 NEC CORP 发明人 TOYA HIROKAZU;KIDO SUSUMU
分类号 G01R31/28;G01R31/30;G06F11/24 主分类号 G01R31/28
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