| 摘要 |
<p>An electro-optical system (400) for gauging the surface profile (424) on a test object (426) includes an image sensor that detects radiation (428) naturally emanating from the test object surface. An attenuating medium (414) is provided to attenuate the radiation as a function of the distance that the radiation travels through the medium (414). The intensity values associated with the radiation across the surface enables the system (400) to quantitatively determine and gauge the surface profile. Inventive means (430, 432) and associated methodology are disclosed that enable the system to correct for optically generated errors in the resulting image where those errors are caused by the nature of the surface being gauged or the components of the gauging system.</p> |
