| 摘要 |
PROBLEM TO BE SOLVED: To provide a calibration board and timing calibration method that calibrate a signal delay between a functional board and a pin of a semiconductor constitute element to be tested prior to testing of the semiconductor constitute element to be tested.SOLUTION: A calibration board calibrating a signal delay of a test channel in an automatic test device is arranged in the automatic test device in a fashion capable of attaching/detaching a plug, and includes: a calibration group; a first common node; and a change-over module 310. Each calibration group includes: a second common node; and an electric conductive pad that is electrically connected to the second common node. Each electric conductive pad is selectively and electrically connected to one test channel. The change-over module is electrically connected to the first common mode and each second common mode. When a first delay calibration procedure is executed, a connection between the first common node and each second common node is cut. When a second calibration procedure is executed, the connection between the first common node and each second common node is established.SELECTED DRAWING: Figure 2 |
