发明名称 Test method of microstructure body and micromachine
摘要 It is an object to provide a test method of a process, an electric characteristic, and a mechanical characteristic of a structure body in a micromachine without contact. A structure body including a first conductive layer, a second conductive layer provided in parallel to the first conductive layer, and a sacrifice layer or a space provided between the first conductive layer and the second conductive layer is provided; an antenna connected to the structure body is provided; electric power is supplied to the structure body wirelessly through the antenna; and an electromagnetic wave generated from the antenna is detected as a characteristic of the structure body.
申请公布号 US7808253(B2) 申请公布日期 2010.10.05
申请号 US20060565135 申请日期 2006.11.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAGUCHI MAYUMI;IZUMI KONAMI;TATEISHI FUMINORI
分类号 G01R27/32;B81C99/00;G01M99/00;G01R31/26 主分类号 G01R27/32
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