| 摘要 |
PROBLEM TO BE SOLVED: To generate a test set in the small number of patterns in a short time. SOLUTION: A fault is selected by a fault selection part 113. Whenever the allocation of a signal value is changed by a signal-value change part 116, a control set is computed by a control-set computing part 124 so as to be stored in a control-set storage part 125. A present control set and a past control set are compared by a similarity judgment part so as the judge their similarity. When the similarity is judged to be high, the search of a decision tree is discontinued, and test pattern candidates are synthesized by a test-pattern-candidate synthesis part 132. By a test compression part 150, a test compression processing operation is executed to the set of the test pattern candidates obtained in this manner. |
