发明名称 Array of nonvolatile memory cells having at least five memory cells per unit cell, having a plurality of the unit cells which individually comprise three elevational regions of programmable material, and/or having a continuous volume having a combination of a plurality of vertically oriented memory cells and a plurality of horizontally oriented memory cells; array of vertically stacked tiers of nonvolatile memory cells
摘要 Disclosed is an array of nonvolatile memory cells includes five memory cells per unit cell. Also disclosed is an array of vertically stacked tiers of nonvolatile memory cells that includes five memory cells occupying a continuous horizontal area of 4F2 within an individual of the tiers. Also disclosed is an array of nonvolatile memory cells comprising a plurality of unit cells which individually comprise three elevational regions of programmable material, the three elevational regions comprising the programmable material of at least three different memory cells of the unit cell. Also disclosed is an array of vertically stacked tiers of nonvolatile memory cells that includes a continuous volume having a combination of a plurality of vertically oriented memory cells and a plurality of horizontally oriented memory cells. Other embodiments and aspects are disclosed.
申请公布号 US9454997(B2) 申请公布日期 2016.09.27
申请号 US201012959015 申请日期 2010.12.02
申请人 Micron Technology, Inc. 发明人 Liu Jun
分类号 G11C5/02;H01L27/24;H01L27/10;H01L27/06;G11C13/00;H01L45/00 主分类号 G11C5/02
代理机构 Wells St. John, P.S. 代理人 Wells St. John, P.S.
主权项 1. An array of nonvolatile memory cells comprising a repetition of a unit cell, the unit cell being the smallest, simplest polyhedron that embodies all structural characteristics of, and by three-dimensional repetition makes up, a lattice of the array; the array comprising five memory cells per unit cell, the unit cell comprising a plurality of electrode lines having programmable material there-between, the electrode lines extending through the polyhedron.
地址 Boise ID US