发明名称 SUBSTRATE TEMPERATURE ADJUSTMENT MECHANISM FOR PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate temperature adjustment mechanism for plasma processing apparatus, capable of preventing discharge in a heating medium as much as possible, while ensuring sufficient heat transfer effect.SOLUTION: A reverse path 30 partially having a flow path 33 in a reverse direction is provided in a heat transfer medium flow path 25 between a substrate mounting table placed in the plasma processing chamber, and having a heat transfer medium holding space, and a heat transfer medium source for supplying a heat transfer medium to the heat transfer medium holding space. Normally, even if discharge takes place in the heat transfer medium between a heat transfer medium source of the ground potential and the substrate mounting table applied with a high voltage for plasma processing, the charges generated by the discharge in the heat transfer medium must flow while resisting against the reverse potential difference in the flow path 33 in a reverse direction, and thereby it is difficult to continue discharge in the heat transfer medium.SELECTED DRAWING: Figure 2
申请公布号 JP2016219729(A) 申请公布日期 2016.12.22
申请号 JP20150106237 申请日期 2015.05.26
申请人 SAMCO INC 发明人 HASEGAWA KIYOSHI;NAKANO HIROHIKO
分类号 H01L21/3065;C23C16/50;H05H1/46 主分类号 H01L21/3065
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