发明名称 Insulated gate bipolar transistor having high short-circuit and latch-up withstandability
摘要 An IGBT has an emitter bypass structure. The interval D between N emitter regions is adapted to be larger than two times of a channel length L in order to effectively decrease a channel width to effectively decrease a saturation current. A high concentration region may be provided in a P base region, which is closer to the end portion of the P base region than the emitter regions between the emitter regions, so that the channel width can be effectively decreased even without the relation of D>2L. A channel width per unit area WU may be in a range of 140 cm-1</=WU</=280 cm-1 in an IGBT of a breakdown voltage class of 500-750 V or 70 cm-1</=WU</=150 cm-1 in an IGBT of a breakdown voltage class of 1000-1500 V, so that an IGBT having a short-circuit withstandability and a latch-up withstandability suitable for an inverter can be implemented.
申请公布号 US5391898(A) 申请公布日期 1995.02.21
申请号 US19920926378 申请日期 1992.08.10
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HAGINO, HIROYASU
分类号 H01L29/68;H01L29/06;H01L29/10;H01L29/739;H01L29/78;(IPC1-7):H01L29/74;H01L31/111;H01L23/58;H01L29/76 主分类号 H01L29/68
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