发明名称 Non-volatile memory and method with reduced bit line crosstalk errors
摘要 A memory device and a method thereof allow sensing a plurality of memory cells in parallel while minimizing errors caused by bit-line to bit-line crosstalk. Essentially, the bit line voltages of the plurality of bit line coupled to the plurality of memory cells are controlled such that the voltage difference between each adjacent pair of lines is substantially independent of time while their conduction currents are being sensed. When this condition is imposed, all the alternate currents due to the various bit line capacitance drop out since they all depend on a time varying voltage difference. In another aspect, sensing the memory cell's conduction current is effected by noting its rate of discharging a dedicated capacitor provided in the sense amplifier.
申请公布号 US7443757(B2) 申请公布日期 2008.10.28
申请号 US20020254898 申请日期 2002.09.24
申请人 SANDISK CORPORATION 发明人 CERNEA RAUL-ADRIAN;LI YAN
分类号 G11C7/00;G11C7/06;G11C11/56;G11C16/26 主分类号 G11C7/00
代理机构 代理人
主权项
地址