发明名称 Method of forming a landing pad structure in an integrated circuit
摘要 A method is provided for forming a landing pad of a semiconductor integrated circuit, and an integrated circuit formed according to the same. A plurality of conductive regions are formed over a substrate. A polysilicon landing pad is formed over at least one of the plurality of conductive regions. After the polysilicon is patterned and etched to form the landing pad, tungsten is then selectively deposited over the polysilicon to form a composite polysilicon/tungsten landing pad which is a good etch stop, a good barrier to aluminum/silicon interdiffusion and a good conductor.
申请公布号 US6025265(A) 申请公布日期 2000.02.15
申请号 US19970989953 申请日期 1997.12.12
申请人 STMICROELECTRONICS, INC. 发明人 MILLER, ROBERT OTIS;SMITH, GREGORY CLIFFORD
分类号 H01L21/28;H01L21/285;H01L21/336;H01L21/768;H01L23/485;H01L23/522;H01L23/532;H01L29/78;(IPC1-7):H01L21/320;H01L21/476;H01L21/44 主分类号 H01L21/28
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