发明名称 |
PHOTO DETECTOR AND FABRICATION METHOD THEREOF |
摘要 |
PURPOSE: A photo detector and a fabrication method thereof are provided to realize a relatively larger light-receiving area and a smaller capacitance for high response speed. CONSTITUTION: A photo detector includes a lower semiconductor layer(61) doped with n-type, an intrinsic semiconductor layer(63) for receiving incident light, an upper semiconductor layer(65) doped with p-type, which are sequentially formed by epitaxial growth on a substrate(50) doped with n-type. The photo detector further includes a lower electrode(51) formed under the substrate(50) and an upper electrode(53) formed on the upper semiconductor layer(65). In particular, the upper semiconductor layer(65) is formed on only a portion of the intrinsic semiconductor layer(63). Therefore, part of incident light is directly projected to the intrinsic semiconductor layer(63), thereby reducing capacitance of the photo detector.
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申请公布号 |
KR20010009571(A) |
申请公布日期 |
2001.02.05 |
申请号 |
KR19990027990 |
申请日期 |
1999.07.12 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HWANG, UNG RIN;KIM, JUN YEONG |
分类号 |
H01L31/10;H01L21/331;H01L27/14;(IPC1-7):H01L31/10 |
主分类号 |
H01L31/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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