发明名称 PHOTO DETECTOR AND FABRICATION METHOD THEREOF
摘要 PURPOSE: A photo detector and a fabrication method thereof are provided to realize a relatively larger light-receiving area and a smaller capacitance for high response speed. CONSTITUTION: A photo detector includes a lower semiconductor layer(61) doped with n-type, an intrinsic semiconductor layer(63) for receiving incident light, an upper semiconductor layer(65) doped with p-type, which are sequentially formed by epitaxial growth on a substrate(50) doped with n-type. The photo detector further includes a lower electrode(51) formed under the substrate(50) and an upper electrode(53) formed on the upper semiconductor layer(65). In particular, the upper semiconductor layer(65) is formed on only a portion of the intrinsic semiconductor layer(63). Therefore, part of incident light is directly projected to the intrinsic semiconductor layer(63), thereby reducing capacitance of the photo detector.
申请公布号 KR20010009571(A) 申请公布日期 2001.02.05
申请号 KR19990027990 申请日期 1999.07.12
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, UNG RIN;KIM, JUN YEONG
分类号 H01L31/10;H01L21/331;H01L27/14;(IPC1-7):H01L31/10 主分类号 H01L31/10
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