发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device with which much etching residues can be removed as generated at the time of forming a contact hole. SOLUTION: In the manufacturing method of the semiconductor device; a silicon substrate 10 is prepared, an insulating film 20 is deposited on the silicone substrate, and the insulating film is etched. Thus, the contact hole 30 reaching the silicon substrate is formed. The etching residues 50 remaining in a base of the contact hole is removed by using a silicon etching process and a silicon oxide film etching process. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007324198(A) 申请公布日期 2007.12.13
申请号 JP20060149977 申请日期 2006.05.30
申请人 TOSHIBA CORP 发明人 SHIGEOKA TAKASHI
分类号 H01L21/768;H01L21/28 主分类号 H01L21/768
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