发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To attain longer time program counter trace using a small-capacity trace memory in a built-in SoC (system on chip) having a trace function. SOLUTION: For example, it is transferred to a trace memory control part 43 within a debug module 40 through signal lines 31a and 32a that the internal state of function modules (1)31 and (2)32 is an idle state. Meanwhile, the trace memory part 42 regularly monitors a trace memory 43 for free space, and gives, before the free space is used up, an instruction to a debug module control part 41 to stop the operation of a processor core 20. The operation of the processor core 20 is temporarily stopped in this way when the function modules (1)31 and (2)32 are in the idle state, and the operation of the processor core 20 is restarted after trace information stored in the trace memory 43 is fetched. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009048474(A) 申请公布日期 2009.03.05
申请号 JP20070214972 申请日期 2007.08.21
申请人 TOSHIBA CORP 发明人 WAKUTSU TAKASHI
分类号 G06F11/28 主分类号 G06F11/28
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