CMM PROBE PATH CONTROLLER AND METHOD

摘要

A method and apparatus for measuring an object using a CMM receives nominal geometry data relating to the object, and produces a set-up path based on the received nominal geometry data. The method also conducts a set-up measurement of the object using a CMM probe. The CMM probe conducts the set-up measurement by following the set-up path, and the set-up measurement of the object produces scan path information. The method generates a scan path using the scan path information, and controls the CMM probe to conduct a fine measurement of the object by causing the CMM probe to move along the generated scan path.

主权项

1. A method of measuring an object using a CMM, the method comprising:
receiving nominal geometry data relating to the object; producing a set-up path based on the received nominal geometry data; conducting a set-up measurement of the object using a CMM probe, the CMM probe conducting the set-up measurement by following the set-up path, the set-up measurement of the object producing scan path information; generating a scan path using the scan path information; and controlling the CMM probe to conduct a fine measurement of the object by moving the CMM probe along the generated scan path relative to the object.