PHASE-CONTROLLED THIN FILM MULTILAYERS FOR MICHELSON INTERFEROMETERS

摘要

An achromatically phase-controlled mirror comprising a mosaic of optical thin film multilayers deposited on a substrate, each of the thin film multilayers being characterized by a predetermined number of layers each of predetermined optical thickness for establishing predetermined reflectance and phase changes on reflectance for respective ones of the thin film multilayers. The difference between the phase changes for respective ones of the multilayers remains substantially constant over a predetermined range of optical wavelengths.