| 摘要 |
A memory device for data storage has a memory module with at least one memory bank in which data are stored and from which the stored data are read out, and a logic unit for controlling a writing and a reading of data to and from the at least one memory bank. Furthermore, a test module for testing the functionality of the memory module is provided. The test module is arranged in a manner separated from the memory module in a separate circuit unit, and is connected to the memory module via a communication device for the exchange of communication signals
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