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发明名称
Verfahren und Schaltung zum Testen von integriertem Speicher
摘要
申请公布号
DE69501662(T2)
申请公布日期
1998.06.18
申请号
DE19956001662T
申请日期
1995.12.14
申请人
SGS-THOMSON MICROELECTRONICS S.A., GENTILLY, FR
发明人
MIRABEL, JEAN-MICHEL, F-94230 CACHAN, FR;YERO, EMILIO, F-94230 CACHAN, FR
分类号
G01R31/28;G11C29/00;G11C29/12;G11C29/50;G11C29/56;(IPC1-7):G11C29/00
主分类号
G01R31/28
代理机构
代理人
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地址
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