发明名称 PATTERNING DURING FILM GROWTH
摘要 The growing surface of a material such as InGaN is exposed to a small diameter laser beam that is directed to controlled locations, such as by scanning mirrors. Material characteristics may be modified at the points of exposure. In one embodiment, mole fraction of selected material is reduced where laser exposure takes place. In one embodiment, the material is grown in a MBE or CVD chamber.
申请公布号 WO2008045130(A3) 申请公布日期 2008.07.17
申请号 WO2007US04068 申请日期 2007.02.16
申请人 CORNELL RESEARCH FOUNDATION, INC.;SCHAFF, WILLIAM J.;CHEN, XIAODONG 发明人 SCHAFF, WILLIAM J.;CHEN, XIAODONG
分类号 C23C16/04 主分类号 C23C16/04
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