发明名称 Bumped die and wire bonded board-on-chip package
摘要 An apparatus for making a semiconductor assembly and, specifically, interconnecting a semiconductor die to a carrier substrate. The carrier substrate includes a first surface and a second surface with at least one opening therethrough. The die includes an active surface and a back surface, wherein the die is attached facedown to the first surface of the carrier substrate with conductive bumps therebetween. In addition, a plurality of bond wires is attached through the at least one opening in the carrier substrate between the active surface of the die and the second surface of the carrier substrate. With this arrangement, both the conductive bumps and the bond wires share in the electrical interconnection between the die and the carrier substrate, thereby allowing more space for bond pads to interconnect with bond wires and/or allowing for smaller die sizes.
申请公布号 US7115990(B2) 申请公布日期 2006.10.03
申请号 US20040793564 申请日期 2004.03.04
申请人 MICRON TECHNOLOGY, INC. 发明人 KINSMAN LARRY D.
分类号 H01L23/48;H01L21/56;H01L21/60;H01L23/31;H01L23/498 主分类号 H01L23/48
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