发明名称 Semiconductor process and fin-shaped field effect transistor
摘要 A semiconductor process includes the following steps. A fin on a substrate is provided. Spacers are formed only on sidewalls of the fin, where a top surface of the fin is higher than or equal to top surfaces of the spacers. An epitaxial structure is formed on the fin. The present invention also provides a fin-shaped field effect transistor including a fin, spacers and an epitaxial structure. The fin is located on a substrate. The spacers are disposed only on sidewalls of the fin, where a top surface of the fin is higher than or equal to top surfaces of the spacers. The epitaxial structure is disposed on the fin.
申请公布号 US9450094(B1) 申请公布日期 2016.09.20
申请号 US201514848305 申请日期 2015.09.08
申请人 UNITED MICROELECTRONICS CORP. 发明人 Yeh Chih-Chieh;Lee Kai-Lin
分类号 H01L29/06;H01L29/78;H01L29/66;H01L29/08;H01L29/267 主分类号 H01L29/06
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. A semiconductor process, comprising: providing a fin on a substrate; and forming spacers only on sidewalls of the fin, wherein a top surface of the fin is higher than or equal to top surfaces of the spacers, and a part of the substrate beside the fin is not covered by the spacers while the spacers are formed and the fin is exposed; and forming an epitaxial structure on the fin.
地址 Hsin-Chu TW