发明名称 |
Semiconductor process and fin-shaped field effect transistor |
摘要 |
A semiconductor process includes the following steps. A fin on a substrate is provided. Spacers are formed only on sidewalls of the fin, where a top surface of the fin is higher than or equal to top surfaces of the spacers. An epitaxial structure is formed on the fin. The present invention also provides a fin-shaped field effect transistor including a fin, spacers and an epitaxial structure. The fin is located on a substrate. The spacers are disposed only on sidewalls of the fin, where a top surface of the fin is higher than or equal to top surfaces of the spacers. The epitaxial structure is disposed on the fin. |
申请公布号 |
US9450094(B1) |
申请公布日期 |
2016.09.20 |
申请号 |
US201514848305 |
申请日期 |
2015.09.08 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Yeh Chih-Chieh;Lee Kai-Lin |
分类号 |
H01L29/06;H01L29/78;H01L29/66;H01L29/08;H01L29/267 |
主分类号 |
H01L29/06 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. A semiconductor process, comprising:
providing a fin on a substrate; and forming spacers only on sidewalls of the fin, wherein a top surface of the fin is higher than or equal to top surfaces of the spacers, and a part of the substrate beside the fin is not covered by the spacers while the spacers are formed and the fin is exposed; and forming an epitaxial structure on the fin. |
地址 |
Hsin-Chu TW |