发明名称 CARRIER HEAD HAVING SUBSTRATE DETECTING MECHANISM FOR MECHANICAL-CHEMICAL POLISHING DEVICE
摘要 PROBLEM TO BE SOLVED: To securely detect the existence of a substrate in a carrier head and to operate a device without exposing the inside of the carrier head to the contamination by a slurry. SOLUTION: This carrier head 100 for a mechanical-chemical polishing device 20 includes a substrate detecting mechanism. The carrier head 10 includes a base 22 and a flexible member which is connected to the base 22, and partitions a chamber. The lower surface of the flexible member provides a substrate receiving surface. The substrate detecting mechanism includes a sensor to measure the pressure of the chamber and to display the output signal to display the result; and a processor composed to display whether the substrate is installed to the substrate receiving surface or not, according to the output signal.
申请公布号 JPH10337658(A) 申请公布日期 1998.12.22
申请号 JP19980143025 申请日期 1998.05.25
申请人 APPLIED MATERIALS INC 发明人 BORIS GOUZMAN;ZUNIGA STEVEN;CHEN HUNG;SOMEKH SASSON
分类号 B24B37/005;B24B37/30;H01L21/304 主分类号 B24B37/005
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