发明名称 |
CARRIER HEAD HAVING SUBSTRATE DETECTING MECHANISM FOR MECHANICAL-CHEMICAL POLISHING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To securely detect the existence of a substrate in a carrier head and to operate a device without exposing the inside of the carrier head to the contamination by a slurry. SOLUTION: This carrier head 100 for a mechanical-chemical polishing device 20 includes a substrate detecting mechanism. The carrier head 10 includes a base 22 and a flexible member which is connected to the base 22, and partitions a chamber. The lower surface of the flexible member provides a substrate receiving surface. The substrate detecting mechanism includes a sensor to measure the pressure of the chamber and to display the output signal to display the result; and a processor composed to display whether the substrate is installed to the substrate receiving surface or not, according to the output signal. |
申请公布号 |
JPH10337658(A) |
申请公布日期 |
1998.12.22 |
申请号 |
JP19980143025 |
申请日期 |
1998.05.25 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
BORIS GOUZMAN;ZUNIGA STEVEN;CHEN HUNG;SOMEKH SASSON |
分类号 |
B24B37/005;B24B37/30;H01L21/304 |
主分类号 |
B24B37/005 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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