发明名称 CHAMBER FOR REDUCING CONTAMINATION DURING CHEMICAL VAPOR DEPOSITION
摘要 This invention relates to the design of apparatus for processing electronic devices, including equipment for chemical vapor deposition or transport polymerization. The new designs of gas separator plates, their configuration, and the regulation of gas flows through the system provides control over the pattern of precursor gas flow away from the separation plates, thereby decreasing the amount of byproducts that are deposited on the plates and throughout the reactor. New designs for shaping other surfaces of the dispersion head reduces contamination of those elements, and new designs for chamber panels decrease the deposition of byproducts on those surfaces, as well as other elements of the reactor. Decreasing deposition of byproducts increases the amount and the quality of the film that can be deposited without requiring the system to be shut down for cleaning. This increases the throughput of products in the deposition process, thereby increasing the efficiency of electronic device manufacture and lowering the cost.
申请公布号 WO9950474(A1) 申请公布日期 1999.10.07
申请号 WO1999US06781 申请日期 1999.03.29
申请人 QUESTER TECHNOLOGY, INC. 发明人 LEKSELL, DAVID;CHAN, MING, XI;ELLUL, JOSEPH, P.;LUCE, JEANNE, L.;RYAN, DAVID, T.;SHAREEF, IQBAL, A.;LEE, CHUNG, J.;CAMPBELL, STEPHEN, M.;FOGGIATO, GIOVANNI, ANTONIO
分类号 C23C16/44;C23C16/455;H01L21/205;(IPC1-7):C23C16/00 主分类号 C23C16/44
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