发明名称 |
Vehicle identification based on an image |
摘要 |
A machine may be configured as a vehicle identification machine to identify a model of a vehicle based on an image that depicts a dashboard of the vehicle. As configured, the machine may receive an image of the dashboard, where the image depicts a layout of instrumentation within the dashboard. The machine may identify the layout of instrumentation by processing the image. For example, the machine may process the image by determining a position of an instrument within the layout of instrumentation, determining an outline of instrument, or both. The machine may access a data record that correlates a model of the vehicle with the identified layout of instrumentation and, based on the data record, identify the model of the vehicle. The machine may then provide a notification that references the vehicle, references the identified model of the vehicle, or references both. |
申请公布号 |
US9471839(B2) |
申请公布日期 |
2016.10.18 |
申请号 |
US201514964999 |
申请日期 |
2015.12.10 |
申请人 |
eBay Inc. |
发明人 |
Conradt Jonathan Leonard |
分类号 |
G06K9/00;G06K9/20;G06K9/46;G06K9/62;G06T7/00;G01M17/00;G06Q30/00;G06Q10/00 |
主分类号 |
G06K9/00 |
代理机构 |
Schwegman, Lundberg & Woessner, P.A. |
代理人 |
Schwegman, Lundberg & Woessner, P.A. |
主权项 |
1. A system comprising:
one or more processors; and a machine-readable storage device comprising instructions that, when executed by the one or more processors, cause the one or more processors to perform operations comprising: receiving one or more features of an instrument panel of a vehicle, the instrument panel having a first instrument and a second instrument in a layout of instrumentation; modeling the layout of instrumentation by representing the first instrument and the second instrument as a first layout model, the first layout model having a first outline corresponding to the first instrument, a second outline corresponding to the second instrument, and a relative position of the first outline and the second outline, and determining a visible interior edge of an instrument and a visible exterior edge of an instrument for one or more of the first outline or the second outline; determining a correspondence between the first layout model and a second layout model; and based on the correspondence between the first layout model and the second layout model, providing a notification identifying a vehicle model corresponding to the second layout model as a vehicle model for the first layout model. |
地址 |
San Jose CA US |