发明名称 Contact plug forming method
摘要 An inter-level insulation film is formed on a first-level interconnection layer and part of the inter-level insulation film which lies on the first-level interconnection layer is etched to form a contact hole. After a natural oxidation film formed on the surface of part of the first-level interconnection layer which is exposed in the contact hole is removed, the resultant structure is exposed to a gas atmosphere containing halogen to purify the surface of the inter-level insulation film. After this, a contact plug is deposited and formed on the first-level interconnection layer which is exposed in the contact hole by the selective CVD method to fill in the contact hole. A second-level interconnection layer is formed on the inter-level insulation film and the first-level and second-level interconnection layers are electrically connected to each other via the contact plug.
申请公布号 US5607878(A) 申请公布日期 1997.03.04
申请号 US19950526543 申请日期 1995.09.12
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 OTSUKA, MARI;KITAKURA, TOMONORI;OTSUKA, KENICHI;MORI, KAZUYA
分类号 H01L21/768;(IPC1-7):H01L21/28 主分类号 H01L21/768
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