SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST SYSTEM THEREOF,申请号KR20050014344-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST SYSTEM THEREOF
摘要
申请公布号	KR100712090(B1)	申请公布日期	2007.05.02
申请号	KR20050014344	申请日期	2005.02.22
申请人		发明人
分类号	G01R31/26;G01R31/28	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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