SEMICONDUCTOR INTEGRATED CIRCUIT, DEBUG/TRACE CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT OPERATION OBSERVING METHOD

摘要

A main functional structure executes continuous predetermined operations to continuously generate events associated with the operations. A debug/trace circuit compares an event occurring at the main functional structure with detection condition indicating information of one entry in a control information list, and executes the operation designated by operation indicating information paired with the detection condition indicating information in accordance with the result of the comparison. The debug/trace circuit continuously performs this in accordance with the control information list to identify the event.