发明名称 PATTERN FORMING METHOD AND EXPOSURE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a pattern forming method which can increase a productivity by increasing a pattern accuracy during formation of a pattern, and also an exposure apparatus using the method. <P>SOLUTION: A member 5 (liquid repellent film 6) as a processing target and a photomask 7 are spaced to define a space between the liquid repellent film 6 formed on the processing target member 5 and the photomask 7. A nitrogen gas 18 is introduced from a gas generator 16 via an inlet pipe 15 into the space between the liquid repellent film 6 formed on the processing target member 5 and the photomask 7. Ultraviolet light 13 is applied to a wiring pattern formation of the processing target member 5 via light transmitters 10 of the photomask 7, so that the liquid repellent film 6 corresponding to the wiring pattern formation breaks down and a volatile component is generated. The generated volatile component is emitted into the space between the liquid repellent film 6 formed on the processing target member 5 and the photomask 7, and then externally discharged together with the nitrogen gas 18 from the space through an exhaustion pipe 19. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006261428(A) 申请公布日期 2006.09.28
申请号 JP20050077490 申请日期 2005.03.17
申请人 SEIKO EPSON CORP 发明人 CHO KEIHEI;KIMURA SATOSHI;FURUHATA HIDEMICHI
分类号 H01L21/027;G03F7/20;G03F7/38 主分类号 H01L21/027
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