| 发明名称 |
TEST FITMENT |
| 摘要 |
The invention relates to a removable test fitment which may be readily locatable to remove it from a complex system, specifically to the removal of test fitments which are installed in low light or confined spaces.;There is provided a removable test fitment suitable for use to temporarily monitor a complex system, wherein said removable test fitting comprises an indicator to identify the presence of the component within the complex system. |
| 申请公布号 |
US2016231147(A1) |
申请公布日期 |
2016.08.11 |
| 申请号 |
US201415024240 |
申请日期 |
2014.09.19 |
| 申请人 |
BAE SYSTEMS PLC |
发明人 |
WALKER MICHAEL HENRY;TAYLOR RUSSELL BRIAN |
| 分类号 |
G01D11/28;G01D11/30 |
主分类号 |
G01D11/28 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A removable test fitment suitable for use to temporarily monitor a complex system, wherein said removable test fitment comprises an indicator to identify the presence of the test fitment within the complex system such as to facilitate the test fitment's subsequent removal. |
| 地址 |
London GB |
