TEST EQUIPMENT FOR SERVER

摘要

According to the present invention, a test device for a server can comprise: a test chamber; a plurality of test boards for a server which are separately arranged while the test boards are erect in the test chamber wherein a plurality of CPUs are mounted in each of the test boards; and a plurality of memory modules mounted on each test board for a server in parallel with each test board for a server, and controlled by each CPU of each test board for a server. As such, the test device is able to efficiently cool each CPU.