| 摘要 |
A temperature sensor (TS) is located very close to the semiconductor (T), e.g. integrated in the semiconductor body. The temperature signal (Tj) is processed in a differentiator (DIF) to determine its rate of change (DTj). This value is then compared in a comparator (K1) with a reference rate of change (Uref) to determine whether temperature conditions are present which indicate that a safe junction temperature is likely to be exceeded, in which case a signal (KS) is sent to the semiconductor controller (1) to turn off the semiconductor .
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