发明名称 METHOD OF RECORDING TEMPORARY DEFECT LIST ON WRITE-ONCE RECORDING MEDIUM, METHOD OF REPRODUCING THE TEMPORARY DEFECT LIST, RECORDING AND/OR REPRODUCING APPARATUS, AND THE WRITE-ONCE RECORDING MEDIUM
摘要 A method of recording a temporary defect list on a write-once recording medium, a method of reproducing the temporary defect list, an apparatus for recording and/or reproducing the temporary defect list, and the write-once recording medium. The method of recording a temporary defect list for defect management on a write-once recording medium includes recording the temporary defect list, which is created while data is recorded on the write-once recording medium, in at least one cluster of the write-once recording medium, and verifying if a defect is generated in the at least one cluster. Then, the method includes re-recording data originally recorded in a defective cluster in another cluster, and recording pointer information, which indicates a location of the at least one cluster where the temporary defect list is recorded, on the write-once recording medium.
申请公布号 US2008094962(A1) 申请公布日期 2008.04.24
申请号 US20070962724 申请日期 2007.12.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG SUNG-HEE;KO JUNG-WAN
分类号 G11B19/02;G11B5/09;G11B7/0037;G11B7/007;G11B19/04;G11B20/18 主分类号 G11B19/02
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